SYAFALNI, I.; ADIONO, T. Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning. Jurnal Nasional Teknik Elektro, [S. l.], v. 11, n. 1, p. 36–42, 2022. DOI: 10.25077/jnte.v11n1.1007.2022. Disponível em: http://jnte.ft.unand.ac.id/index.php/jnte/article/view/1007. Acesso em: 9 may. 2024.