SYAFALNI, Infall; ADIONO, Trio. Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning. Jurnal Nasional Teknik Elektro, [S. l.], v. 11, n. 1, p. 36–42, 2022. DOI: 10.25077/jnte.v11n1.1007.2022. Disponível em: https://jnte.ft.unand.ac.id/index.php/jnte/article/view/1007. Acesso em: 28 feb. 2026.