Syafalni, Infall, and Trio Adiono. “Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM Using Machine Learning”. Jurnal Nasional Teknik Elektro 11, no. 1 (March 29, 2022): 36–42. Accessed February 28, 2026. https://jnte.ft.unand.ac.id/index.php/jnte/article/view/1007.